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- cold test cover EVOLUTION
cold test cover EVOLUTION
saving cost, minimizing downtime
- (r)evolutionary state-of-the-art docking and handler chamber sealing solution
- intuition-based, technologically advanced design novelty
- universal tester/handler compatibility
- compatibility with third-party dockings will be verified at request
- protection against CUH/handler chamber icing
- operating temperature ranging from -50 °C to +150 °C (-58 °F to +302 °F)
- reverting system conducting purge air back into handler chamber + dual-sealing plate
- cold test cover assembly permanently attached to handler
- docking and alignment features integrated into cold test cover assembly
- test cell servicing with closed sealing cover for up to 30 minutes
- automatic or mechanical push-button system operation options
- cost-/time-saving + yield-/quality-increasing operation features
- durable and robust design
- single module or integrated dib-changing solution
- optional product features and upgrade integrations:
- sensor-controlled temperature detection + cold temperature guard/alarm system
- integrated dib-changing solution:- dib exchange time of less than 1 minute
- side-mapping
- touch panel operation
- programmable user interface
- individual, password-protected control options
- with esmo semicon lupo cart, installation of cold test cover EVOLUTION to handler in less than 1 hour