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direct docking

wafer probing w/o pogo tower

  • compatible with various types of probers
  • suitable for various types of test heads and probe cards
  • inserts for various test head applications available
  • retrofit of existing prober possible
  • for top-load applications only
  • facilitated installation due to simple prober head plate exchange
  • onsite installation possible
  • ease of use + handling
  • smart + cost-effective solution

download information brochure