EXPRESS configurator for your TH/prober/handler etc.

esmo semicon @ SWTest 2025

Precision in Wafer-Level Testing

From June 2–4, 2025, esmo semicon participated in the Semiconductor Wafer Test Conference (SWTest) in Carlsbad, California – one of the industry's leading events focused exclusively on wafer and die-level testing. Known for its highly specialized technical program and strong engineering community, SWTest provided the ideal platform to present our latest innovations and engage directly with test professionals from around the globe.

At Booth #204, esmo showcased cutting-edge developments in handler technology, manipulators, and docking/interface solutions. Designed for high accuracy, reliability, and integration flexibility, these systems support advanced semiconductor testing across R&D and high-volume manufacturing environments.

Focused Innovations for Evolving Test Challenges

  • Handler: Our latest solutions offer enhanced automation, precision alignment to ensure consistent test conditions and protect device integrity.

  • Docking & Interface Technology: esmo’s docking systems are engineered for mechanical stability and repeatable test performance, minimizing setup time while maximizing accuracy in signal integrity.

  • Manipulator Solutions: With robust mechanical design and ergonomic operation, esmo manipulators support flexible positioning and fast changeover for a broad range of DUT configurations.

Visitors had the opportunity to speak directly with our US team, including Bert Bustamante and Homan Amin, who provided insights into current industry trends, technical requirements, and esmo’s approach to solving complex test challenges.

Moving the Industry Forward

SWTest 2025 once again proved that innovation in wafer testing is driven by hands-on engineering excellence and open technical exchange. We thank all attendees who stopped by our booth and contributed to the discussions that will help shape the next generation of semiconductor test solutions.