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contacting solutions
for demanding semiconductor test applications
With its dedicated Contacting Team, esmo semicon is building expertise in this field. The team complements esmo semicon’s existing activities
in handling and automation systems, test-head manipulation, docking and interface systems, and the integration of equipment into test cells.
Contacting is a critical part of semiconductor testing. It provides the interface through which electrical signals and power are transferred between the device under test and the test system, while the mechanical conditions of the contact must remain controlled and repeatable throughout the test process.
A Contacting solution needs to match the complete test setup, including the device, package, electrical requirements, temperature conditions and mechanical interface. Depending on the application, key considerations can include:
- signal and power transfer
- current carrying capability
- contact resistance and stability
- high-frequency signal integrity
- temperature handling
- alignment and compliance
- repeatability across test cycles
With its dedicated Contacting Team, esmo semicon is building expertise in this field. The team complements esmo semicon’s existing activities
in handling and automation systems, test-head manipulation, docking and interface systems, and the integration of equipment into test cells.
Markets and applications
Contacting requirements differ from one semiconductor market to another. The esmo Contacting Team is preparing its activities around the following key markets and application areas:
Automotive power and electric mobility
For power semiconductors used in electric vehicles, vehicle power systems and related automotive applications.
Typical focus areas:
- electrical load and power transfer
- thermal test conditions
- package and interface design
- repeatable test behaviour
Renewable energy and grid technology
For devices used in solar inverters, wind-energy systems, energy storage and other power-conversion applications.
Typical focus areas:
- current handling
- temperature conditions
- stable electrical interfaces
- integration into the overall test environment
Industrial automation and motor control
For semiconductors used in motor drives, robotics, factory automation and industrial control systems.
Typical focus areas:
- power handling
- production test suitability
- mechanical stability
- long-term contact behaviour
Microcontrollers and ASICs
For digital devices used in automotive, industrial and embedded applications.
Typical focus areas:
- parallel testing
- package geometry and alignment
- signal integrity
- repeatable contact behaviour
Consumer electronics and embedded devices
For semiconductor devices used in consumer and connected products.
Typical focus areas:
- compact package interfaces
- efficient test processes
- reliable electrical connections
- adaptation to the test setup
Precision analog, sensor and RF applications
For sensors, signal-conditioning devices, precision analog components and high-frequency devices.
Typical focus areas:
- measurement stability
- controlled electrical characteristics
- signal integrity
- grounding and interface design
The exact requirements depend on the device, package, lead or pad configuration, test conditions and overall system architecture. esmo semicon therefore considers Contacting as part of the complete test environment rather than as an isolated component.
From autumn 2026, esmo semicon will gradually publish further information about its Contacting activities and planned solutions on its website.
Visitors can also meet the esmo Contacting Team at SEMICON India and SEMICON Europa in Munich to discuss Contacting requirements, application conditions and possible approaches for semiconductor testing.
Meet the contacting experts live
From autumn 2026, esmo semicon will gradually publish further information about its Contacting activities and planned solutions on its website.
Visitors can also meet the esmo Contacting Team at SEMICON India (Sept. 17–18,2026, Yashobhoomi, Delhi, India) and
SEMICON Europa in Munich (Nov. 10–13, 2026, Messe Muenchen) to discuss contacting requirements, application conditions and possible approaches for semiconductor testing.
