• compatible with various types of probers
• suitable for various types of test heads and probe cards
• inserts for various test head applications available
• retrofit of existing prober possible
• for top-load applications only
• facilitated installation due to simple prober head plate exchange
• onsite installation possible
• ease of use + handling
• smart + cost-effective solution

• docking-interfacing datasheet

• a result of more than 10 years‘ experience
• revolutionary electrical operation functions
• highest repeatability
• z-position teaching feature repeatability of +/- 20 µm in z-axis
• repeatability of +/- 25 µm in x- and y-axes
• up to 4 kN locking force (up to 1,000 N per docking module)
• electrical synchronization of docking modules
• touch panel with z-position teaching feature
• EMO on touch panel
• individual positioning of each docking module
• 20 mm adjustment of z-position range
• zero risk of collision with docked board
• durable and robust design
• cost-/time-saving operation
• pin-catch feature in pre-docked position
• state-of-the-art touch panel operation
• compatible with great variety of test head solutions
• compatible with great variety of handler/prober solutions

• docking-interfacing datasheet
• helios docking datasheet

• special design for test heads with automatic board
• cost-efficient solution including pre-guide, pre-fix, or k-dock adapter
• locking mechanism (i.e. Teradyne FLEX family, inner pull-down)

• docking-interfacing datasheet

• pre-guide/pre-fix set
• guide pins for various test heads
• fully compatible with existing dockings

• docking-interfacing datasheet

cost-efficient solution

• docking-interfacing datasheet