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handler-attached dib-loading system

board change in less than 1 minute

  • quick + easy board change in less than one minute, by one person only (one-person operation)
  • highly efficient + time-saving operation
  • highest repeatability due to –   
    • mechanical test head/handler connection during board change process
    • statically defined test head positioning
  • sensor monitoring feature preventing operating errors
  • short-term return of investment
  • dedicated for final test processes
  • high locking force
  • single-sequence operation for docking/undocking
  • touch panel operation
  • programmable user interface
  • individual password-protected control options
  • contact force fully compensated by locking system
  • durable + robust design
  • compatible with great variety of test head solutions
  • designed for high parallel test setups
  • customer-testified yield improvement by 3% due to permanent, mechanical tester/handler connection – no time-consuming troubleshooting required, no stress on the boards
  • quick + easy + ergonomic board access
  • a result of more than 25 years' experience