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- DIB changing systems
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- dib-changing system
test-head-attached dib-changing system
quick + easy board change in less than a minute
- quick + easy board change in less than one minute
- highly efficient + time-saving operation
- highest repeatability due to mechanical test head/handler connection during board change process
- short-term return of investment
- dedicated for final test
- highest repeatability due to statically defined test head positioning
- high locking force
- single sequence operation for docking/undocking
- adjustable docking force
- force deactivation feature
- adjustable z-stack
- touch panel operation
- programmable user interface
- individual password-protected control options
- cold test applicability
- contact force fully compensated by locking system
- default-type board orientation
- durable + robust design
- facilitated change from hand test to production mode
- compatible with great variety of test head solutions
- facilitated installation with esmo semicon lupo cart