In 2013, we introduced a revolutionary, cost- and time-saving interfacing solution which consequently was very well-received by the semiconductor market: the esmo semicon cold test cover.
In sync with our consistent commitment to high quality standards and proactively responding to contemporary test floor demands, we have continued to innovatively improve this device, and are now pleased to present our (r)evolutionary device for downtime reduction to our international customer base: the esmo semicon cold test cover EVOLUTION.
This state-of-the-art docking and handler chamber sealing solution is a technologically advanced, intuition-based design novelty, offering the great benefit of saving cost and minimizing downtimes.
The esmo semicon cold test cover EVOLUTION closes the temperature chambers of conventional device handlers during board change to keep the cold air inside. This significantly reduces the downtimes otherwise required for de-icing processes.
It convinces with its universal tester/handler compatibility as well as its comprehensive variety of (optional) product features and upgrade integrations.
Depending on your individual requirements, you may select a single module or an integrated dib-changing solution, and opt for automatic or mechanical, push-button system operations.
For further details, please click cold test cover EVOLUTION ::: smart-feature device.
In case you wish you get in touch with us, please click YOUR esmo semicon POCs – we very much look forward to meeting you and introducing our products/services to you in greater detail.